National Instruments Corporation 960003-TOK-SGS

TML PRESSURE AND STRAIN SENSOR SET.

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National Instruments Corporation 865387-71

NI ECUTS-16001 ECU TEST SYSTEM 40U FOR CBC3-01DUT

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National Instruments Corporation 865387-57

ECU TEST SYSTEM 40U FOR FORD BMS V5-02DUT

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National Instruments Corporation 868170-03B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH...

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National Instruments Corporation 868170-03C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH...

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National Instruments Corporation 868170-03CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 8 CH CONFIG,...

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National Instruments Corporation 866077-01

STS T4 TEST SYSTEM

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National Instruments Corporation 865387-67

ECU TEST SYSTEM 40U FOR -02DUT

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National Instruments Corporation 875139-01

ECU TEST SYSTEM 40U - BMS CELL SIM 54CH

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National Instruments Corporation 865761-01

VRTS BASE SYSTEM WITH ADDITIONAL RADIO HEAD W/O RF MEASUREMENTS

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National Instruments Corporation 868143-01

SPIRENT ONLY - 5G NR TEST GNB FOR FR1, PXIE-8881 AND 1095

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National Instruments Corporation 861306-14

ETX-16401, INVERTER PRODUCTION TEST SYSTEM, HIGH POWER, 240V

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National Instruments Corporation 861306-11

ETX-16301, INVERTER PRODUCTION TEST SYSTEM, PULSER, HV POWER SUPPLY, 240V

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National Instruments Corporation 861306-12

ETX-16309, INVERTER PRODUCTION TEST SYSTEM, PULSER, HV POWER SUPPLY, CUSTOM,...

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National Instruments Corporation 861306-13

ETX-16400, INVERTER PRODUCTION TEST SYSTEM, HIGH POWER, 480V

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National Instruments Corporation 875148-01

CCS ECU TEST SYSTEM 40U FOR ZF IDC6 - HBT

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National Instruments Corporation 865760-01

VRTS BASE SYSTEM WITH ADDITIONAL RADIO HEAD INCLUDING RF MEASUREMENTS

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National Instruments Corporation 861306-07

ETX-16201 INVERTER PRODUCTION TEST SYSTEM, PULSER, HV POWER SUPPLY

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National Instruments Corporation 866161-01

STS T4M2 TEST SYSTEM

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National Instruments Corporation 861306-09

ETX-16203 INVERTER PRODUCTION TEST SYSTEM, PULSER, HV POWER SUPPLY, FLEXRAY

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National Instruments Corporation 875098-01

EGSE ECU PAYLOAD TEST SET

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National Instruments Corporation 875129-01

CCS, POWER DISTRIBUTION UNIT TEST SET

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National Instruments Corporation 868170-04B

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH...

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National Instruments Corporation 868170-04C

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH...

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National Instruments Corporation 868170-04CN

ULTRA FAST PARAMETRIC IV KIT FOR AC WAFER RELIABILITY TEST - 10 CH CONFIG,...

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National Instruments Corporation 868107-03B

NI 6G SUB-THZ RFIC TEST, 18 SLOTS, 26.5GHZ VST 2GHZ BW, 20GHZ SIG GEN, 1.5 GHZ...

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National Instruments Corporation 868107-03C

NI 6G SUB-THZ RFIC TEST, 18 SLOTS, 26.5GHZ VST 2GHZ BW, 20GHZ SIG GEN, 1.5 GHZ...

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National Instruments Corporation 868107-03CN

NI 6G SUB-THZ TEST, 18 SLOTS, 26.5GHZ VST 2GHZ BW, 20GHZ SIG GEN, 1.5GHZ...

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National Instruments Corporation 875223-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - LEFT/DRIVER

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National Instruments Corporation 875222-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - FRONT

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National Instruments Corporation 875221-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - BACK

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National Instruments Corporation 875224-01

CCS, VALEO - HIL VALIDATION TEST SYSTEM FOR ZONAL CONTROL - PASSENGER

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National Instruments Corporation 875146-01

CCS ECU TEST SYSTEM 40U FOR ZF IDC6 - EOL

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National Instruments Corporation 875346-01

CCS, BMS TEST SYSTEM - LIFETIME TEST

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National Instruments Corporation 875245-01

POWER CYCLING TEST BENCH, 2X6 CHANNEL, 1000A 30V

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National Instruments Corporation 875068-01

CCS, ECU PAYLOAD TEST SET

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National Instruments Corporation 868107-01C

NI 6G SUB-THZ RFIC TEST, 18 SLOTS, 23GHZ VST 4GHZ BW, 20GHZ SIG GEN, 1.5 GHZ...

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National Instruments Corporation 868107-01B

NI 6G SUB-THZ RFIC TEST, 18 SLOTS, 23GHZ VST 4GHZ BW, 20GHZ SIG GEN, 1.5 GHZ...

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National Instruments Corporation 875058-01

CCS,NGC CMTS TEST RACK

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National Instruments Corporation 868057-01

LED PRODUCTION TEST PXI BUNDLE

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National Instruments Corporation 863226-01

CCS, CHANGE ORDER - BEV-T - ELECTRONIC LOAD, LEAK TEST, ELECTRICAL GRID...

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National Instruments Corporation 865854-01

CCS,EE-A HIL TEST SYSTEM FOR MAGNA (USA)

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National Instruments Corporation 865856-01

CCS,EE-A HIL TEST SYSTEM FOR MAGNA (AUSTRIA)

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National Instruments Corporation 865855-01

CCS,EE-A HIL TEST SYSTEM FOR MAGNA (INDIA)

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National Instruments Corporation 868107-04B

NI 6G SUB-THZ TEST, 18 SLOTS, 26.5GHZ VST 2GHZ BW CO-PROCESSOR,20GHZ SIGG,1.5...

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National Instruments Corporation 868107-04C

NI 6G SUB-THZ TEST, 18 SLOTS, 26.5GHZ VST 2GHZ BW CO-PROCESSOR,20GHZ SIGG,1.5...

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National Instruments Corporation 868107-04CN

NI 6G SUB-THZ TEST, 18 SLOTS, 26GHZ VST 2GHZ BW CO-PROCESSOR, 20GHZ SIGG,1.5GHZ...

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National Instruments Corporation 868107-02B

NI 6G SUB-THZ RFIC TEST, 18 SLOTS, 23GHZ VST 4GHZ BW CO-PROCESSOR,20GHZ...

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National Instruments Corporation 868107-02C

NI 6G SUB-THZ RFIC TEST,18 SLOTS,23GHZ VST 4GHZ BW CO-PROCESSOR,20GHZ SIGG,1.5...

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National Instruments Corporation 875052-01

CCS,LGC TEST SYSTEM

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